Analysis of the electrical impedance spectroscopy measurements of ZnTe:Ni thin film deposited by R–F sputtering - Détails de la publication

Production Scientifique P.S.

Analysis of the electrical impedance spectroscopy measurements of ZnTe:Ni thin film deposited by R–F sputtering

Auteur

M. Chaik , S. Ben Moumen , R. Bouferra, A. Outzourhit, L. Essaleh

Revue

Superlattices and Microstructures

Année

2020

Chercheur

Bouferra Rachid

Voir le profil du chercheur →