Electric field mapping by Pockels effect and I(V) characteristic of CdTe nuclear detectors by different Pt contact deposition - Détails de la publication

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Electric field mapping by Pockels effect and I(V) characteristic of CdTe nuclear detectors by different Pt contact deposition

Auteur

F. Lmai, A. Elouafi, M. Chafi, R. Moubah, S. Bahsine, M. Ayoub

Revue

Materials Today: Proceedings

Année

2024

DOI

10.1016/j.matpr.2024.02.045

Chercheur

BAHSINE SAIDA

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