Numerical analysis of lossy non uniform interconnect lines in modern integrated circuits by multistep teta-method and Rung midpoint method - Détails de la publication

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Numerical analysis of lossy non uniform interconnect lines in modern integrated circuits by multistep teta-method and Rung midpoint method

Auteur

K. Ait Belaid, H. Belahrach, A. Ghammaz, H. Ayad

Revue

Journal of Computational Electronics

Année

2023

DOI

DOI: 10.1007/s10825-23-02109-6

Chercheur

GHAMMAZ Abdelilah

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