Analysis of the electrical impedance spectroscopy measurements of ZnTe:Ni thin film deposited by R–F sputtering - Détails de la publication

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Analysis of the electrical impedance spectroscopy measurements of ZnTe:Ni thin film deposited by R–F sputtering

Auteur

M Chaik, S Ben Moumen, R Bouferra, A Outzourhit, L Essaleh

Revue

Superlattices and Microstructures

Année

2020

DOI

10.1016/j.spmi.2019.106319

Chercheur

Outzourhit Abdelkader

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