• FTIR and Raman study of rapid thermal annealing and oxidation effects on structural properties of silicon-rich SixC1-x thin films deposited by R.F co-sputtering
Auteur
A. El khalfi, E. Ech-chamikh, Y. Ijdiyaou, M.Azizan, A. Essafti, L. Nkhaili, A. El Kissani, E. Tomasella
