Studies of structural, optical, morphological and electrical properties of RF sputtered V2O5 thin films with annealing of 400 °C - Détails de la communication

Production Scientifique P.S.

Studies of structural, optical, morphological and electrical properties of RF sputtered V2O5 thin films with annealing of 400 °C

Auteur

M. Bousseta, L. Nkhaili, A. Narjis, A. EL Hichou, A. Outzourhit

Manifestation

International Conference (AMPSECA)

Date

2024-10-24

Organisation

Marrakech, Morocco

Chercheur

NKHAILI LAHCEN

Voir le profil du chercheur →