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Characterization and enhancement of CTS thin films via RF Sputtering: structural, optical, and electrical profiling

Auteur

M. Bousseta, W. Riad, Z. AQCHMAR, L. Amiri, S. Elmassi, L. Nkhaili, A. Outzourhit

Manifestation

International Conference (E-WAV)

Date

2024-10-24

Organisation

Marrakech, Morocco

Chercheur

NKHAILI LAHCEN

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