Effect of RF power and annealing on the structural, optical and morphological properties of RF-sputtered V2O5 thin films. - Détails de la communication

Production Scientifique P.S.

Effect of RF power and annealing on the structural, optical and morphological properties of RF-sputtered V2O5 thin films.

Auteur

Mohammed.Bousseta*, L. Nkhali, A. Narjis, A. EL Hichou, A. Outzourhit

Manifestation

Poster

Date

2021-12-17

Organisation

Calais,France

Chercheur

Outzourhit Abdelkader

Voir le profil du chercheur →